Title :
Method for BJT transit time evaluation
Author :
Zimmer, T. ; Duluc, J.B. ; Lewis, N.
Author_Institution :
Bordeaux I Univ., Talence, France
fDate :
10/1/1998 12:00:00 AM
Abstract :
A new method is presented for calculating the forward transit time of bipolar junction transistors. The method uses three easily extractable SPICE parameters from the Gummel Poon model. No S parameter measurements are necessary to determine the forward transit time, only DC and C(V) measurements need to be performed, and no technological information is needed
Keywords :
SPICE; bipolar transistors; semiconductor device models; BJT; Gummel Poon model; SPICE parameter extraction; bipolar junction transistor; transit time;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19981219
