Title :
Low voltage built-in current sensor
Author :
Lee, Kuen-Jong ; Huang, Kou-Shung ; Huang, Min-Cheng
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
fDate :
10/10/1996 12:00:00 AM
Abstract :
A low voltage built-in current sensor (BICS) for IDDQ testing based on the bulk-driven current mirror technique is proposed. This design has a small overhead in terms of area and needs only one external power supply. Different current resolution requirements can be met by adjusting the aspect ratio of the transistors in the design. HSPICE simulation results show that high error detection speed and small performance impact on the original circuit are also achieved
Keywords :
CMOS integrated circuits; SPICE; built-in self test; digital simulation; electric sensing devices; integrated circuit testing; CMOS; HSPICE simulation; IDDQ testing; IC testing; area overhead; aspect ratio; built-in current sensor; bulk-driven current mirror technique; current resolution requirements; error detection speed;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19961296
