DocumentCode
1436444
Title
Pitfalls of accelerated testing
Author
Meeker, William Q. ; Escobar, Luis A.
Author_Institution
Dept. of Stat., Iowa State Univ., Ames, IA, USA
Volume
47
Issue
2
fYear
1998
fDate
6/1/1998 12:00:00 AM
Firstpage
114
Lastpage
118
Abstract
Accelerated tests are used to obtain timely information on product life or performance degradation over time. Test units are used more frequently than usual or are subjected to higher than usual levels of accelerating variables like temperature and voltage. Then the results are used, through an appropriate physically-based statistical model, to make predictions about product life or performance over time, at the more moderate use conditions. The extrapolative predictions inherent in the use of accelerated testing raise serious concerns, and the use of accelerated testing has many dangerous pitfalls. This paper warns potential users about some of these pitfalls
Keywords
failure analysis; life testing; reliability; statistical analysis; accelerated testing pitfalls; accelerating variables; extrapolative predictions; lifetime predictions; performance degradation; product life; statistical model; temperature; voltage; Acceleration; Circuit testing; Data analysis; Degradation; Integrated circuit testing; Life estimation; Life testing; Temperature; Uncertainty; Voltage;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/24.722271
Filename
722271
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