DocumentCode :
1436444
Title :
Pitfalls of accelerated testing
Author :
Meeker, William Q. ; Escobar, Luis A.
Author_Institution :
Dept. of Stat., Iowa State Univ., Ames, IA, USA
Volume :
47
Issue :
2
fYear :
1998
fDate :
6/1/1998 12:00:00 AM
Firstpage :
114
Lastpage :
118
Abstract :
Accelerated tests are used to obtain timely information on product life or performance degradation over time. Test units are used more frequently than usual or are subjected to higher than usual levels of accelerating variables like temperature and voltage. Then the results are used, through an appropriate physically-based statistical model, to make predictions about product life or performance over time, at the more moderate use conditions. The extrapolative predictions inherent in the use of accelerated testing raise serious concerns, and the use of accelerated testing has many dangerous pitfalls. This paper warns potential users about some of these pitfalls
Keywords :
failure analysis; life testing; reliability; statistical analysis; accelerated testing pitfalls; accelerating variables; extrapolative predictions; lifetime predictions; performance degradation; product life; statistical model; temperature; voltage; Acceleration; Circuit testing; Data analysis; Degradation; Integrated circuit testing; Life estimation; Life testing; Temperature; Uncertainty; Voltage;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/24.722271
Filename :
722271
Link To Document :
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