• DocumentCode
    1436444
  • Title

    Pitfalls of accelerated testing

  • Author

    Meeker, William Q. ; Escobar, Luis A.

  • Author_Institution
    Dept. of Stat., Iowa State Univ., Ames, IA, USA
  • Volume
    47
  • Issue
    2
  • fYear
    1998
  • fDate
    6/1/1998 12:00:00 AM
  • Firstpage
    114
  • Lastpage
    118
  • Abstract
    Accelerated tests are used to obtain timely information on product life or performance degradation over time. Test units are used more frequently than usual or are subjected to higher than usual levels of accelerating variables like temperature and voltage. Then the results are used, through an appropriate physically-based statistical model, to make predictions about product life or performance over time, at the more moderate use conditions. The extrapolative predictions inherent in the use of accelerated testing raise serious concerns, and the use of accelerated testing has many dangerous pitfalls. This paper warns potential users about some of these pitfalls
  • Keywords
    failure analysis; life testing; reliability; statistical analysis; accelerated testing pitfalls; accelerating variables; extrapolative predictions; lifetime predictions; performance degradation; product life; statistical model; temperature; voltage; Acceleration; Circuit testing; Data analysis; Degradation; Integrated circuit testing; Life estimation; Life testing; Temperature; Uncertainty; Voltage;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.722271
  • Filename
    722271