• DocumentCode
    1436505
  • Title

    A Novel Pixel Design for AM-OLED Displays Using Nanocrystalline Silicon TFTs

  • Author

    Lin, Chen-Wei ; Chao, Mango C -T ; Huang, Yen-Shih

  • Author_Institution
    Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • Volume
    19
  • Issue
    6
  • fYear
    2011
  • fDate
    6/1/2011 12:00:00 AM
  • Firstpage
    939
  • Lastpage
    952
  • Abstract
    This paper presents a novel pixel design for active matrix organic light emitting diode (AM-OLED) displays using nanocrystalline silicon thin-film transistors (TFTs). The proposed pixel design can effectively reduce the variation of its stored display data caused by the leakage current of nanocrystalline silicon TFTs, which can in turn increase the contrast resolution of AM-OLED displays. With a proper setting of its capacitors, the proposed pixel design can achieve a 5.55× reduction on its display-data variation while requiring only a 1.15× write time when compared to the typical pixel design. The aperture ratio resulting from the layout of the proposed pixel design can also be maintained above 40%, which satisfies the specification of most AM-OLED displays. A series of simulations as well as measurement results are provided to validate the effectiveness of the proposed pixel design.
  • Keywords
    elemental semiconductors; leakage currents; nanoelectronics; organic light emitting diodes; silicon; thin film transistors; AM-OLED display design; Si; active matrix organic light emitting diode displays; capacitors; contrast resolution; display-data variation; leakage current; nanocrystalline silicon TFT; pixel design; thin-film transistors; Active matrix organic light emitting diodes; Backplanes; Chaos; Costs; Flat panel displays; Liquid crystal displays; Manufacturing; Organic light emitting diodes; Silicon; Thin film transistors; Active Matrix Organic Light Emitting Diode (AM-OLED); coupling effect; microcrystalline thin-film transistor (TFT); nanocrystalline TFT;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2010.2042735
  • Filename
    5428768