Title :
Built-in dynamic thermal testing technique for ICs
Author :
Altet, J. ; Rubio, A.
Author_Institution :
Dept. of Electron. Eng., Univ. Politecnica de Catalunya, Barcelona, Spain
fDate :
10/10/1996 12:00:00 AM
Abstract :
The continuing reduction in the size of CMOS logic ICs is leading to an increase in leakage current, in such devices, making it difficult to use existing testing techniques. The authors present an alternative built-in testing technique based on dynamic thermal considerations
Keywords :
CMOS logic circuits; built-in self test; integrated circuit testing; logic testing; CMOS logic ICs; built-in thermal testing; dynamic thermal testing technique; leakage current;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19961307
