• DocumentCode
    1436744
  • Title

    Built-in dynamic thermal testing technique for ICs

  • Author

    Altet, J. ; Rubio, A.

  • Author_Institution
    Dept. of Electron. Eng., Univ. Politecnica de Catalunya, Barcelona, Spain
  • Volume
    32
  • Issue
    21
  • fYear
    1996
  • fDate
    10/10/1996 12:00:00 AM
  • Firstpage
    1982
  • Lastpage
    1984
  • Abstract
    The continuing reduction in the size of CMOS logic ICs is leading to an increase in leakage current, in such devices, making it difficult to use existing testing techniques. The authors present an alternative built-in testing technique based on dynamic thermal considerations
  • Keywords
    CMOS logic circuits; built-in self test; integrated circuit testing; logic testing; CMOS logic ICs; built-in thermal testing; dynamic thermal testing technique; leakage current;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19961307
  • Filename
    542880
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1436744