• DocumentCode
    1436850
  • Title

    Bayesian Tag Estimate and Optimal Frame Length for Anti-Collision Aloha RFID System

  • Author

    Wu, Haifeng ; Zeng, Yu

  • Author_Institution
    Sch. of Electr. & Inf. Technol., Yunnan Univ. of Nat., Kunming, China
  • Volume
    7
  • Issue
    4
  • fYear
    2010
  • Firstpage
    963
  • Lastpage
    969
  • Abstract
    In a dynamic framed slotted aloha RFID system, the key technique can be divided into two parts: precisely estimating tag quantity and determining an optimal frame length. For estimating tag quantity, this paper uses three risk functions to propose three Bayesian estimates, and improves the estimates to reduce computational complexity. For determining an optimal frame length, this paper derives an optimal frame length, which can make the system achieve maximum channel usage efficiency under the condition that the durations of an idle, a collision and a successful slot are not identical. In our simulations, comparison with several conventional tag estimates shows that the proposed Bayesian tag estimates have less error. In addition, the improved estimates have lower computational complexity and their estimate performance is not reduced. The simulations results also indicate that the derived optimal frame length guarantees the maximum channel usage efficiency.
  • Keywords
    Bayes methods; access protocols; computational complexity; estimation theory; radiofrequency identification; Bayesian tag estimate; anti-collision aloha RFID system; computational complexity; dynamic framed slotted aloha RFID system; maximum channel usage efficiency; optimal frame length; tag quantity estimation; Base stations; Bayesian methods; Computational complexity; Computational modeling; Information technology; Laboratories; RFID tags; Radiofrequency identification; Throughput; Wireless sensor networks; Anti-collision; RFID; frame length; framed aloha; tag estimate;
  • fLanguage
    English
  • Journal_Title
    Automation Science and Engineering, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1545-5955
  • Type

    jour

  • DOI
    10.1109/TASE.2010.2042957
  • Filename
    5428812