Transient and steady-state performance of potential devices

THE increasing use of high-speed relaying with the resulting emphasis on the transient performance of potential devices has led to an extensive analysis of their performance under transient conditions. Both analytical and network-calculator methods have been developed for predetermining transient performance. Tests have been made to substantiate the methods of analysis and to show the character of the transient and extent of control in typical cases. Novel means have, likewise, been devised for presenting the steady-state performance of the device. In particular, the introduction of the equivalent circuit of the device represents an important advance in the visualization, both of the transient and steady-state performance. In this paper, after a brief description of circuit arrangements of the potential devices under discussion, the new theoretical methods are presented, followed by the substantiating test information.