DocumentCode
1437131
Title
System-level performance evaluation of three-dimensional integrated circuits
Author
Rahman, Arifur ; Reif, Rafael
Author_Institution
Microsystems Technol. Lab., MIT, Cambridge, MA, USA
Volume
8
Issue
6
fYear
2000
Firstpage
671
Lastpage
678
Abstract
In this paper, the wire (interconnect)-length distribution of three-dimensional (3-D) integrated circuits (ICs) is derived using Rent´s rule and following the methodology used to estimate two-dimensional (2-D) (wire-length distribution). Two limiting cases of connectivity between logic gates on different device layers are examined by comparing the wire-length distribution and average and total wire-length. System performance metrics such as clock frequency, chip area, etc., are estimated using wire-length distribution, interconnect delay criteria, and simple models representing the cost or complexity for manufacturing 3-D ICs. The technology requirement for interconnects in 3-D integration is also discussed.
Keywords
VLSI; circuit layout CAD; delays; integrated circuit interconnections; integrated circuit layout; integrated circuit modelling; wiring; VLSI; chip area; clock frequency; connectivity; device layers; interconnect delay criteria; interconnect-length distribution; system-level performance evaluation; three-dimensional integrated circuits; total wire-length; wire-length distribution; Clocks; Costs; Delay estimation; Frequency estimation; Integrated circuit interconnections; Logic devices; Logic gates; System performance; Two dimensional displays; Wire;
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/92.902261
Filename
902261
Link To Document