Title :
System-level performance evaluation of three-dimensional integrated circuits
Author :
Rahman, Arifur ; Reif, Rafael
Author_Institution :
Microsystems Technol. Lab., MIT, Cambridge, MA, USA
Abstract :
In this paper, the wire (interconnect)-length distribution of three-dimensional (3-D) integrated circuits (ICs) is derived using Rent´s rule and following the methodology used to estimate two-dimensional (2-D) (wire-length distribution). Two limiting cases of connectivity between logic gates on different device layers are examined by comparing the wire-length distribution and average and total wire-length. System performance metrics such as clock frequency, chip area, etc., are estimated using wire-length distribution, interconnect delay criteria, and simple models representing the cost or complexity for manufacturing 3-D ICs. The technology requirement for interconnects in 3-D integration is also discussed.
Keywords :
VLSI; circuit layout CAD; delays; integrated circuit interconnections; integrated circuit layout; integrated circuit modelling; wiring; VLSI; chip area; clock frequency; connectivity; device layers; interconnect delay criteria; interconnect-length distribution; system-level performance evaluation; three-dimensional integrated circuits; total wire-length; wire-length distribution; Clocks; Costs; Delay estimation; Frequency estimation; Integrated circuit interconnections; Logic devices; Logic gates; System performance; Two dimensional displays; Wire;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on