DocumentCode :
1437586
Title :
Bidimensional Statistical Empirical Mode Decomposition
Author :
Kim, Donghoh ; Park, Minjeong ; Oh, Hee-Seok
Author_Institution :
Dept. of Appl. Math., Sejong Univ., Seoul, South Korea
Volume :
19
Issue :
4
fYear :
2012
fDate :
4/1/2012 12:00:00 AM
Firstpage :
191
Lastpage :
194
Abstract :
This letter proposes a new algorithm, termed bidimensional statistical empirical mode decomposition (BSEMD) that adopts a smoothing procedure instead of an interpolation when constructing 2-D upper and lower envelopes. For this purpose, we investigate the sifting process effect of conventional bidimensional empirical mode decomposition (BEMD) on the decomposition results, and propose a modified BEMD via the smoothing sifting process coupling with a new identification method of 2-D local extrema. Furthermore, theoretical rationale for smoothing sifting is investigated.
Keywords :
smoothing methods; statistical analysis; 2D local extrema identification method; 2D upper envelopes; BSEMD; bidimensional statistical empirical mode decomposition; lower envelopes; smoothing sifting process coupling; Interpolation; Materials; Noise measurement; Signal to noise ratio; Smoothing methods; Splines (mathematics); Bidimensional empirical mode decomposition; frequency; sifting; smoothing;
fLanguage :
English
Journal_Title :
Signal Processing Letters, IEEE
Publisher :
ieee
ISSN :
1070-9908
Type :
jour
DOI :
10.1109/LSP.2012.2186566
Filename :
6144702
Link To Document :
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