DocumentCode :
1437864
Title :
Surge Capability Testing of Supercapacitor Families Using a Lightning Surge Simulator
Author :
Kularatna, Nihal ; Fernando, Jayathu ; Pandey, Amit ; James, Sisira
Author_Institution :
Univ. of Waikato, Hamilton, New Zealand
Volume :
58
Issue :
10
fYear :
2011
Firstpage :
4942
Lastpage :
4949
Abstract :
Supercapacitors (SCs) are capable of storing energy in the range of fractional joules to several thousands of joules despite their lower dc voltage ratings. Farad-order capacitances combined with milliohm-order equivalent series resistances provide time constants ranging from fractional seconds to seconds. Given these time constants, compared to the time durations of power line transients in the range of a few microseconds to several hundreds of microseconds, these devices may be able to withstand short-duration surges with energy values specified in IEEE C62-XX series, IEC 61400-4-5, and similar standards. However, there is little or no manufacturer datasheet information on these aspects. This paper provides details of an automatic tester interfaced with a lightning surge simulator, a test procedure, and summarized test data on three different families of SCs. The test data set provides some valuable insight in estimating the capabilities of these new SC families to withstand surges and transients, which, in turn, could lead to nontraditional applications.
Keywords :
IEC standards; IEEE standards; capacitance; electric resistance; electrical engineering computing; lightning; simulation; supercapacitors; test equipment; transients; Farad order capacitance; IEC 61400-4-5 standards; IEEE C62-XX series; automatic tester; lightning surge simulator; milliohm order equivalent series resistances; power line transient; supercapacitor family; surge capability testing; test procedure; time duration; Equivalent circuits; Supercapacitors; Surge protection; Surges; Testing; Transient analysis; Lightning surge simulator (LSS); power conditioning systems; supercapacitors (SCs); transient propagation;
fLanguage :
English
Journal_Title :
Industrial Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0046
Type :
jour
DOI :
10.1109/TIE.2011.2109338
Filename :
5704199
Link To Document :
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