Soft X-ray spectroscopic study of a gas-puff Z-pinch argon plasma

Author

Kim, Seong Ho ; Kim, Dong-Eon ; Lee, Tong Nyong

Author_Institution

Dept. of Phys., Pohang Univ. of Sci. & Technol., South Korea

Volume

26

Issue

4

fYear

1998

fDate

8/1/1998 12:00:00 AM

Firstpage

1108

Lastpage

1112

Abstract

X-ray radiation characteristics of argon plasma produced by a gas-puff Z-pinch device were investigated using an X-ray crystal spectrometer, an X-ray diode, and an extreme ultraviolet (XUV) spectrometer. Using a germanium crystal we have observed spectral emission from Ar XVII produced by hot spots at the pinched stage. With the help of a 2-m grazing incidence XUV spectrometer, the spectrum of 30 to 250 Å were obtained. Strong lines from Ar VIII to Ar XIII were observed with a continuum whose peak is around 120 Å. The radiation energy in the spectral range is estimated to be about 23 joule which is about 0.6% of the electrical energy stored in capacitors

Keywords

X-ray emission spectra; Z pinch; argon; plasma diagnostics; 30 to 250 A; Ar; Ar VIII; Ar XIII; Ar XVII; X-ray crystal spectrometer; X-ray diode; X-ray radiation characteristics; capacitors; electrical energy storage; extreme UV spectrometer; gas-puff Z-pinch Ar plasma; gas-puff Z-pinch device; germanium crystal; grazing incidence XUV spectrometer; hot spots; radiation energy; soft X-ray spectroscopy; spectral emission; spectral range; Argon; Capacitors; Diodes; Plasma devices; Plasma properties; Plasma x-ray sources; Spectroscopy; Switches; X-ray lasers; X-ray scattering;

fLanguage

English

Journal_Title

Plasma Science, IEEE Transactions on

Publisher

ieee

ISSN

0093-3813

Type

jour

DOI

10.1109/27.725139

Filename

725139