Title :
Applying automatic kernel parameter selection method to the full bandwidth RBF kernel function for hyperspectral image classification
Author :
Kai-Ching Chen ; Cheng-Hsuan Li ; Bor-Chen Kuo ; Min-Shian Wang
Author_Institution :
Grad. Inst. of Educ. Meas. & Stat., Nat. Taichung Univ. of Educ., Taichung, Taiwan
Abstract :
The support vector machine (SVM) is widely used in hyperspectral image classification due to the robust to the Hughes phenomenon. However, the performance of SVM highly depends on the kernel parameter selection. Hence, it is hard to apply the SVM based on the kernel with lots of parameters such as the full bandwidth RBF (FRBF) kernel whose number of parameters is equal to the number of features. In our previous study, an automatic kernel parameter selection method (APS) was proposed for the normalized kernel function. The proper kernel parameters are the minimizer of the optimization problem based on the proposed kernel-based class separability measure. In this study, we apply the APS to find the best kernel parameters of the FRBF kernel. Experimental results on the Indian Pine Site dataset show that the SVM based on the FRBF kernel with proper kernel parameters outperforms than the SVM based on the RBF kernel on the small sample size problem.
Keywords :
hyperspectral imaging; image classification; image processing; support vector machines; APS; FRBF kernel; Hughes phenomenon; Indian Pine Site dataset; SVM performance; automatic parameter kernel selection method; feature number; full bandwidth RBF kernel; full bandwidth RBF kernel function; hyperspectral image classification; kernel-based class separability measure; normalized kernel function; optimization problem minimizer; parameter number; proper kernel parameter; small sample size problem; support vector machine; Bandwidth; Hyperspectral imaging; Kernel; Optimization; Support vector machines; Training; Full bandwidth RBF kernel; SVM; kernel parameter selection;
Conference_Titel :
Geoscience and Remote Sensing Symposium (IGARSS), 2014 IEEE International
Conference_Location :
Quebec City, QC
DOI :
10.1109/IGARSS.2014.6947222