DocumentCode :
1438127
Title :
Determination of diffusion length from within a confined region with the use of EBIC
Author :
Ong, Vincent K.S. ; Wu, Dethau
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore
Volume :
48
Issue :
2
fYear :
2001
fDate :
2/1/2001 12:00:00 AM
Firstpage :
332
Lastpage :
337
Abstract :
A new method of extracting minority carrier diffusion length from within a confined region of material is presented in this paper. This technique uses the finite difference method and can be used on samples where the diffusion lengths are longer than the width of the region. This cannot be achieved using the conventional method, which evaluates the negative reciprocal of the slope of the EBIC signals line scan plotted on a semi-logarithmic scale. A limitation of this method is that the beam entrance surface of the sample is assumed to have negligible surface recombination
Keywords :
EBIC; carrier lifetime; finite difference methods; minority carriers; EBIC measurement; confined region; finite difference method; minority carrier diffusion length; parameter extraction; Carrier confinement; Current density; Electron beams; Electron microscopy; Finite difference methods; Length measurement; Radiative recombination; Scanning electron microscopy; Semiconductor materials; Spontaneous emission;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.902735
Filename :
902735
Link To Document :
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