DocumentCode :
1438152
Title :
Distributed B-spline electrothermal models of thyristors proposed for circuit simulation of power electronics
Author :
Hung, Chih-Ju ; Roblin, Patrick ; Akhtar, Siraj
Author_Institution :
Dept. of Electr. Eng., Ohio State Univ., Columbus, OH, USA
Volume :
48
Issue :
2
fYear :
2001
fDate :
2/1/2001 12:00:00 AM
Firstpage :
353
Lastpage :
366
Abstract :
A B-spline based electrothermal model for thyristors is proposed for circuit simulations and is demonstrated for gate-triggered resistive circuits by comparison with PISCES simulation results. The model topology for small area thyristors consists of an electrical device circuit model and a thermal circuit model which are coupled together to establish the interaction between the electrical and thermal responses. A distributed topology is introduced for large area thyristors to simulate the realistic electrothermal spreading effect. Each element of the electrothermal topology is extracted from the DC current-voltage (I-V), quasistatic capacitance-voltage (C-V), and static and transient thermal characteristics simulated with PISCES. The fitting technique relies on B-spline and Tensor Product B-Spline (TPS) numerical methods, as well as, physical-based analytic expressions. This B-spline based electrothermal model is implemented in the SPICE-compatible MISIM circuit simulator. Simulations are performed to obtain the device electrothermal distribution, verify the model accuracy, and demonstrate the device self heating effect for 600 Hz gate-triggered resistive circuits. Excellent agreements are obtained for the DC I-V, transient AC, and electrothermal simulation results between the new circuit model and the PISCES/GIGA simulator for the low-frequency applications considered
Keywords :
circuit simulation; equivalent circuits; numerical analysis; power electronics; semiconductor device models; splines (mathematics); thermal analysis; thyristors; DC current-voltage; I-V characteristics; PISCES; SPICE-compatible MISIM circuit simulator; capacitance-voltage characteristics; circuit simulation; device electrothermal distribution; device self heating effect; distributed B-spline electrothermal models; distributed topology; electrical device circuit model; electrical responses; electrothermal spreading effect; fitting technique; gate-triggered resistive circuits; large area thyristors; low-frequency applications; model accuracy; model topology; numerical methods; power electronics; quasistatic C-V characteristics; small area thyristors; static thermal characteristics; tensor product B-spline method; thermal circuit model; thermal responses; thyristor model; transient AC simulation; transient thermal characteristics; Circuit simulation; Circuit topology; Electrothermal effects; Lighting control; Power electronics; Power semiconductor devices; Semiconductor device modeling; Spline; Thermal management of electronics; Thyristors;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.902739
Filename :
902739
Link To Document :
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