DocumentCode :
1438234
Title :
A new simplified charge pumping current model and its model parameter extraction [MOSFET]
Author :
Li, Hsin-Hsien ; Chu, Yu-lin ; Wu, Ching-Yuan
Author_Institution :
Inst. of Electron., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Volume :
43
Issue :
11
fYear :
1996
fDate :
11/1/1996 12:00:00 AM
Firstpage :
1857
Lastpage :
1863
Abstract :
Using the Shockley-Read-Hall (SRH) theory, a simple analytic charge pumping current model has been developed and its accuracy verified by exact numerical analysis. It is shown that the derived analytic charge pumping current model with constant capture cross sections for electrons and holes does not correctly simulate the rising (falling) edges of the experimental charge pumping current. According to the slopes of the logarithmic charge pumping current, effective capture-cross-section models for elections and holes are proposed and are incorporated into the developed analytic charge pumping current model. It is shown that the experimental charge pumping current can be simulated very well by using the modified analytic model
Keywords :
MOSFET; electron traps; electron-hole recombination; hole traps; interface states; semiconductor device models; MOSFET; Shockley-Read-Hall theory; charge pumping current model; constant capture cross sections; electron capture cross section; hole capture cross section; interface trap states; logarithmic charge pumping current; model parameter extraction; numerical analysis; trapping kinetics; Analytical models; Charge carrier processes; Charge pumps; Electron traps; Equations; Kinetic theory; Nominations and elections; Numerical analysis; Parameter extraction; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.543019
Filename :
543019
Link To Document :
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