DocumentCode :
1438458
Title :
Conductive adhesives for high-frequency applications
Author :
Sihlbom, Rolf ; Dernevik, Markus ; Lai, Zonghe ; Starski, J. Piotr ; Liu, Johan
Author_Institution :
IVF, Molndal, Sweden
Volume :
21
Issue :
3
fYear :
1998
fDate :
9/1/1998 12:00:00 AM
Firstpage :
469
Lastpage :
477
Abstract :
In this paper, we present results from measurements and simulations on epoxy-based anisotropic electrically conductive adhesive joints (ACA). We have studied two different types of connections, flip-chip bonded Si test chip and a simple transmission line gap bridged by a copper foil. The test chips were mounted on three different substrates, a rigid FR-4 board, a flexible board and a high-frequency teflon-based duroid substrate. Equivalent electrical models are discussed based on physical considerations and the parameters were then fitted to measurement data in the high-frequency CAD tool HP MDS, A HP8510 network analyzer was used to measure S-parameters on rigid FR-4 and flexible boards in the frequency range 500 MHz-8 GHz for both flip-chips and bridges. For the duroid mounted flip-chips and bridges, the frequency range was 1-30 GHz. The microstructures of the ACAs were studied by cross-sectioning and then using scanning electron microscopy (SEM). For low frequency applications (500 MHz-8 GHz) the results indicated that the ACA flip-chip joint and the bridge joint mounted on the FR-4 board or flexible board can be used. For high-frequency applications (1-30 GHz) the results showed that the ACA flip-chip joint and the bridge joint mounted on the duroid substrate can be used. For duroid and FR-4 mounted flipchip joints and bridge joints ACA has proved to be as good as or even better than the solder joint, for FR-4 in the frequency range 45 MHz-2 GHz and for the duroid substrate 1-30 GHz
Keywords :
S-parameters; adhesion; conducting materials; fine-pitch technology; flip-chip devices; network analysers; scanning electron microscopy; surface mount technology; 1 to 30 GHz; 45 MHz to 2 GHz; 500 MHz to 8 GHz; S-parameters; conductive adhesives; epoxy-based anisotropic adhesive joints; flexible board; flip-chip bonded Si test chip; high-frequency CAD tool; high-frequency applications; network analyzer; rigid FR-4 board; scanning electron microscopy; teflon-based duroid substrate; transmission line gap; Anisotropic magnetoresistance; Bridges; Conductive adhesives; Conductivity measurement; Electric variables measurement; Frequency measurement; Scanning electron microscopy; Semiconductor device measurement; Testing; Transmission line measurements;
fLanguage :
English
Journal_Title :
Components, Packaging, and Manufacturing Technology, Part A, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9886
Type :
jour
DOI :
10.1109/95.725211
Filename :
725211
Link To Document :
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