Title :
Poirot: applications of a logic fault diagnosis tool
Author :
Venkataraman, Srikanth ; Drummonds, Scott Brady
Abstract :
The Poirot tool isolates and diagnoses defects through fault modeling and simulation. Along with a carefully selected partitioning strategy, functional and sequential test pattern applications show success with circuits having a high degree of observability
Keywords :
fault diagnosis; logic CAD; logic partitioning; Poirot tool; fault modeling; logic fault diagnosis tool; observability; partitioning strategy; simulation; test pattern applications; Automatic test pattern generation; Circuit faults; Circuit simulation; Circuit testing; Clocks; Combinational circuits; Fault diagnosis; Heuristic algorithms; Logic; Sequential analysis;
Journal_Title :
Design & Test of Computers, IEEE
