• DocumentCode
    1438778
  • Title

    IC diagnosis using multiple supply pad IDDQs

  • Author

    Plusquellic, Jim

  • Author_Institution
    Dept. of Comput. Eng., Maryland Univ., Baltimore, MD, USA
  • Volume
    18
  • Issue
    1
  • fYear
    2001
  • Firstpage
    50
  • Lastpage
    61
  • Abstract
    An IDDQ technique is proposed based on an extension of a VDDT-based method called transient signal analysis. The method, called quiescent signal analysis, uses IDDQs measured at multiple supply pins as a means of localizing defects
  • Keywords
    fault location; integrated circuit testing; logic testing; IC diagnosis; VDDT-based method; defects localisation; multiple supply pad IDDQs; multiple supply pins; quiescent signal analysis; transient signal analysis; Atherosclerosis; Bayesian methods; Dictionaries; Electrical resistance measurement; Performance evaluation; Pins; Signal analysis; Statistical analysis; Testing; Transient analysis;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.902822
  • Filename
    902822
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1438778