DocumentCode :
1438907
Title :
Atomistic Investigation of Low-Field Mobility in Graphene Nanoribbons
Author :
Betti, Alessandro ; Fiori, Gianluca ; Iannaccone, Giuseppe
Author_Institution :
Dipt. di Ing. dell´´Inf.: Elettron., Inf., Telecomun., Univ. di Pisa, Pisa, Italy
Volume :
58
Issue :
9
fYear :
2011
Firstpage :
2824
Lastpage :
2830
Abstract :
We have investigated the main scattering mechanisms affecting the mobility in graphene nanoribbons using detailed atomistic simulations. We have considered carrier scattering due to acoustic and optical phonons, edge roughness, single defects, and ionized impurities, and we have defined a methodology based on simulations of statistically meaningful ensembles of nanoribbon segments. Edge disorder heavily affects the mobility at room temperature in narrower nanoribbons, whereas charged impurities and phonons are hardly the limiting factors. Results are favorably compared with the few experiments available in the literature.
Keywords :
carrier mobility; field effect transistors; graphene; impurity scattering; nanostructured materials; phonon-impurity interactions; surface roughness; C; acoustic phonons; atomistic simulations; carrier scattering; edge disorder; edge roughness; field effect transistors; graphene nanoribbons; ionized impurities; limiting factors; low field mobility; optical phonons; single defects; temperature 293 K to 298 K; Acoustics; Computational modeling; Impurities; Optical scattering; Phonons; Resistance; Defects; edge roughness; graphene nanoribbons; impurities; low-field mobility; phonons; scattering;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2010.2100045
Filename :
5704569
Link To Document :
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