Title :
Atomistic Investigation of Low-Field Mobility in Graphene Nanoribbons
Author :
Betti, Alessandro ; Fiori, Gianluca ; Iannaccone, Giuseppe
Author_Institution :
Dipt. di Ing. dell´´Inf.: Elettron., Inf., Telecomun., Univ. di Pisa, Pisa, Italy
Abstract :
We have investigated the main scattering mechanisms affecting the mobility in graphene nanoribbons using detailed atomistic simulations. We have considered carrier scattering due to acoustic and optical phonons, edge roughness, single defects, and ionized impurities, and we have defined a methodology based on simulations of statistically meaningful ensembles of nanoribbon segments. Edge disorder heavily affects the mobility at room temperature in narrower nanoribbons, whereas charged impurities and phonons are hardly the limiting factors. Results are favorably compared with the few experiments available in the literature.
Keywords :
carrier mobility; field effect transistors; graphene; impurity scattering; nanostructured materials; phonon-impurity interactions; surface roughness; C; acoustic phonons; atomistic simulations; carrier scattering; edge disorder; edge roughness; field effect transistors; graphene nanoribbons; ionized impurities; limiting factors; low field mobility; optical phonons; single defects; temperature 293 K to 298 K; Acoustics; Computational modeling; Impurities; Optical scattering; Phonons; Resistance; Defects; edge roughness; graphene nanoribbons; impurities; low-field mobility; phonons; scattering;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2010.2100045