Title :
Quantitatively analyzing the performance of integrated circuits and their reliability
Author :
Wyrwas, Edward J. ; Bernstein, Joseph B.
Abstract :
In this paper the importance of microprocessor and IC device reliability is discussed and how modifying the operational parameters of these devices through over-and under-clocking can either reduce or improve overall reliability, respectively, and directly affect the lifetime of the system in which these devices are installed.
Keywords :
integrated circuit reliability; microprocessor chips; semiconductor device reliability; IC device reliability; integrated circuit reliability; microprocessor reliability; operational parameter; Integrated circuits; Performance evaluation; Quantization; Reliability;
Journal_Title :
Instrumentation & Measurement Magazine, IEEE
DOI :
10.1109/MIM.2011.5704807
