DocumentCode :
1439207
Title :
ASPEN
Volume :
8
Issue :
2
fYear :
2010
Abstract :
Describes the above-named upcoming conference event. May include topics to be covered or calls for papers.
Keywords :
Analytical models; Circuit analysis; Circuit breakers; Circuit faults; Circuit simulation; Discrete event simulation; Protection; Protective relaying; Voltage fluctuations;
fLanguage :
English
Journal_Title :
Power and Energy Magazine, IEEE
Publisher :
ieee
ISSN :
1540-7977
Type :
jour
DOI :
10.1109/MPE.2010.936251
Filename :
5430506
Link To Document :
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