DocumentCode :
1439216
Title :
Analysis of lateral-mode behavior in broad-area InGaN quantum-well lasers
Author :
Chow, W.W. ; Amano, H.
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
Volume :
37
Issue :
2
fYear :
2001
fDate :
2/1/2001 12:00:00 AM
Firstpage :
265
Lastpage :
273
Abstract :
A wave-optical model that is coupled to a microscopic gain theory is used to investigate lateral mode behavior in group-III nitride quantum-well lasers. Beam filamentation due to self-focusing in the gain medium is found to limit fundamental-mode output to narrow stripe lasers or to operation close to lasing threshold. Differences between nitride and conventional near-infrared semiconductor lasers arise because of band structure differences, in particular, the presence of a strong quantum-confined Stark effect in the former. Increasing mirror reflectivities in plane-plane resonators to reduce lasing threshold current tends to exacerbate the filamentation problem. On the other hand, a negative-branch unstable resonator is found to mitigate filament effects, enabling fundamental-mode operation far above threshold in broad-area lasers
Keywords :
III-V semiconductors; gallium compounds; indium compounds; laser cavity resonators; laser mirrors; laser modes; laser stability; laser theory; quantum well lasers; reflectivity; semiconductor device models; InGaN; beam filamentation; broad-area InGaN quantum-well lasers; broad-area lasers; far above threshold; filament effects; fundamental-mode operation; fundamental-mode output; gain medium; group-III nitride quantum-well lasers; lasing threshold; lasing threshold current; lateral-mode behavior; microscopic gain theory; mirror reflectivities; negative-branch unstable resonator; plane-plane resonators; self-focusing; strong quantum-confined Stark effect; Laser beams; Laser modes; Laser theory; Microscopy; Mirrors; Optical coupling; Quantum well lasers; Quantum wells; Semiconductor lasers; Stark effect;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/3.903077
Filename :
903077
Link To Document :
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