The effect of dielectric loss in FDTD simulations of microstrip structures

Author

Wittwer, David C. ; Ziolkowski, Richard W.

Author_Institution

Intel Corp., Chandler, AZ, USA

Volume

49

Issue

2

fYear

2001

fDate

2/1/2001 12:00:00 AM

Firstpage

250

Lastpage

262

Abstract

The importance of dielectric losses in planar microstrip structures is evaluated with the finite-difference time-domain (FDTD) method. This analysis was previously not possible in many FDTD simulators due to a lack of absorbing boundary conditions (ABCs), which appropriately terminate air/dielectric interfaces for which the dielectric is lossy. The newly proposed lossy two-time derivative Lorentzian material (L2TDLM) model ABC allows for these terminations and is presented and implemented here for three-dimensional FDTD simulations. The effect of dielectric losses on several well-known planar microstrip structures is evaluated. It is shown that the inclusion of these losses in FDTD simulations, which is facilitated by the L2TDLM ABC, is, in fact, important to predict the performance of resonant structure on lossy dielectric substrates

Keywords

dielectric losses; finite difference time-domain analysis; microstrip antennas; microstrip circuits; microstrip lines; microwave integrated circuits; absorbing boundary conditions; air/dielectric interfaces; dielectric loss; lossy two-time derivative Lorentzian material; planar microstrip structures; resonant structure; three-dimensional FDTD simulations; Analytical models; Boundary conditions; Dielectric losses; Dielectric materials; Dielectric substrates; Finite difference methods; Microstrip; Performance loss; Predictive models; Time domain analysis;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.903085

Filename

903085