Title :
Electrostatic Tensile Testing Device With Nanonewton and Nanometer Resolution and Its Application to
Nanowire Testing
Author :
Tsuchiya, Toshiyuki ; Ura, Yasutake ; Sugano, Koji ; Tabata, Osamu
Author_Institution :
Dept. of Micro Eng., Kyoto Univ., Kyoto, Japan
fDate :
6/1/2012 12:00:00 AM
Abstract :
In this paper, we report a test stand device for tensile testing nanoscale materials and its application to testing of a fullerene wire. We have developed an electrostatic microelectromechanical-systems tensile testing device which has a comb drive actuator to apply tensile force to a specimen and two capacitances for sensing the displacement to measure the elongation and applied force of the specimen. The force and displacement measurement resolutions have been demonstrated as 2 nN and 0.2 nm, respectively. A freestanding fullerene wire which was about 16 μm long, 2 μm wide, and 40 nm thick was integrated on the device, and the tensile testing of the wire was successfully demonstrated with nano-order resolutions. Measured Young´s modulus and tensile strength of the wire were 5.9 GPa and 17 MPa, respectively.
Keywords :
electrostatic devices; micromechanical devices; nanowires; tensile testing; Young\´s modulus; comb drive actuator; electrostatic microelectromechanical-systems tensile testing device; electrostatic tensile testing device; nanometer resolution; nanonewton resolution; nanowire testing; pressure 17 MPa; pressure 5.9 GPa; size 16 mum; size 2 mum; size 40 nm; tensile force; tensile testing nanoscale materials; Displacement measurement; Electrostatic measurements; Force; Force measurement; Nanoscale devices; Springs; Testing; $hbox{C}_{60}$ nanowire; electrostatic devices; nanoelectromechanical systems; tensile testing;
Journal_Title :
Microelectromechanical Systems, Journal of
DOI :
10.1109/JMEMS.2011.2182503