DocumentCode :
1439558
Title :
Electronic measurement of surge-crest voltages
Author :
Bryant, J. M. ; Newman, Mike
Author_Institution :
University of Minnesota, Minneapolis
Volume :
59
Issue :
12
fYear :
1940
Firstpage :
807
Lastpage :
811
Abstract :
QUICK determinations of crest surge potential values by a simple direct method are often desirable in the laboratory to supplement the cathode-ray oscillograph which records the entire surge phenomenon. The generally used sphere-gap method of potential measurement has, however, the disadvantages that a number of tests must be made in the process of adjusting for the breakdown distance, and sometimes the effect of time lag1,2 of breakdown must be considered. In particular, it has been found in routine laboratory surge testing in connection with insulation co-ordination that sphere-gap measurements are erroneous for short duration potentials even with irradiation3 of the gap when making tests of breakdown on the front of a sharply rising potential wave. Also on such chopped waves it is rather unlikely that the sphere-gap setting would be very close to the breakdown value and accordingly a large number of tests have to be made. It is at times essential that the actual breakdown voltage be recorded in a single test since some test objects can be broken down only once.
Keywords :
Accuracy; Electric potential; Electron tubes; Surges; Voltage measurement; Voltmeters;
fLanguage :
English
Journal_Title :
Electrical Engineering
Publisher :
ieee
ISSN :
0095-9197
Type :
jour
DOI :
10.1109/EE.1940.6435243
Filename :
6435243
Link To Document :
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