DocumentCode :
1439611
Title :
Intensity modulated photoeffects in InP-MIS capacitors
Author :
Madheswaran, M. ; Chakrabarti, P.
Author_Institution :
Dept. of Electron. Eng., Banaras Hindu Univ., Varanasi, India
Volume :
143
Issue :
4
fYear :
1996
fDate :
8/1/1996 12:00:00 AM
Firstpage :
248
Lastpage :
251
Abstract :
The effect of intensity modulated optical illumination on the characteristics of an InP-MIS capacitor has been examined theoretically in the paper. On the basis of the model developed, it has been found that the capacitance of the MIS capacitor can be controlled by an intensity modulated optical signal. The capacitance of the device under strong inversion depends on the optical power as well as the modulation frequency. This optically controlled capacitor can be used in the tank circuit of an oscillator for converting an intensity modulated optical signal into a corresponding frequency modulated electrical signal. Due to a low value of mean lifetime of the carriers, the device can be used over a wider range of frequency compared to conventional silicon MOS capacitors
Keywords :
III-V semiconductors; MIS capacitors; carrier lifetime; electro-optical modulation; indium compounds; photocapacitance; CCD image sensor capacitors; InP; InP-MIS capacitors; capacitance; carrier lifetime; frequency modulated electrical signal; intensity modulated optical illumination; intensity modulated optical signal; intensity modulated photoeffects; mean lifetime; modulation frequency; optical power; optically controlled capacitor; oscillator; strong inversion; tank circuit;
fLanguage :
English
Journal_Title :
Optoelectronics, IEE Proceedings -
Publisher :
iet
ISSN :
1350-2433
Type :
jour
DOI :
10.1049/ip-opt:19960389
Filename :
543059
Link To Document :
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