Title :
Embedded Analog Nonvolatile Memory With Bidirectional and Linear Programmability
Author :
Wu, Yi-Da ; Cheng, Kok-Choon ; Lu, Chih-Cheng ; Chen, Hsin
Author_Institution :
Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Abstract :
Nonvolatile storage of analog values with floating-gate transistors has been useful for many applications. While most proposed analog nonvolatile memory devices employ electron tunneling to modify floating-gate charges, this brief presents an embedded analog nonvolatile memory device that employs only hot-carrier injections to achieve bidirectional programmability. Without using electron tunneling, the proposed circuit not only avoids multiplexing high-voltage signals but also facilitates direct storage of new data. In addition, each memory cell incorporates a simple inverter to make the programming process nearly linear, facilitating bidirectional and linear adaptability for neuromorphic systems. A prototype array of the analog memory has been fabricated with the standard CMOS 0.35- technology. The chip includes a simple on-chip comparator to program the analog memory accurately and automatically by negative feedback. The effective resolution is more than 8 bits over a dynamic range of 1.4 V. The intercell disturbance during programming and the data retention ability are also examined.
Keywords :
CMOS memory circuits; linear programming; random-access storage; tunnelling; bidirectional programmability; data retention ability; electron tunneling; embedded analog nonvolatile memory devices; floating-gate charges; floating-gate transistors; high-voltage signals; hot-carrier injections; linear programmability; neuromorphic systems; nonvolatile storage; on-chip comparator; prototype array; size 0.35 mum; standard CMOS technology; voltage 1.4 V; Analog memory; Arrays; Logic gates; Nonvolatile memory; Programming; Tunneling; Analog nonvolatile memory; bidirectional programmability; floating-gate transistors; neuromorphic engineering;
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
DOI :
10.1109/TCSII.2012.2184371