Integration of Behavioral Models in the Full-Field TLM Method

Author

Scott, Ian ; Kumar, Varindra ; Christopoulos, Christos ; Thomas, Dave W P ; Greedy, Stephen ; Sewell, Phillip

Author_Institution

George Green Inst. for Electromagn. Res., Univ. of Nottingham, Nottingham, UK

Volume

54

Issue

2

fYear

2012

fDate

4/1/2012 12:00:00 AM

Firstpage

359

Lastpage

366

Abstract

The accurate simulation of digital circuits requires the inclusion of field phenomena. Issues such as signal integrity, crosstalk, and external EMI are of paramount importance in the design stage, due to the decreasing feature size and increasing clock frequency of modern digital systems. This paper addresses issues with the incorporation of field phenomena in the simulation of digital systems, by embedding behavioral descriptions of digital ICs into a full wave field model. The paper successfully simulates digital circuits incorporating the external electromagnetic interference (EMI) environment of operation; further research is required to incorporate the internal EMI effects in the IC silicon. The transmission-line modeling method is used for the field model, while the input/output buffer information specification models the digital IC behavior.

Keywords

electromagnetic interference; integrated circuit modelling; transmission line theory; EMI; EMI environment; IC silicon; behavioral models; clock frequency; digital IC; digital integrated circuits; electromagnetic interference environment; full-field TLM method; input-output buffer information specification models; internal EMI effects; Integrated circuit modeling; Load modeling; Logic gates; Time domain analysis; Time varying systems; Wires; Behavioral models; hybrid methods; input/output buffer information specification (IBIS); numerical modeling; transmission-line modeling (TLM);

fLanguage

English

Journal_Title

Electromagnetic Compatibility, IEEE Transactions on

Publisher

ieee

ISSN

0018-9375

Type

jour

DOI

10.1109/TEMC.2012.2183133

Filename

6145643