DocumentCode :
1439939
Title :
What is the Young´s Modulus of Silicon?
Author :
Hopcroft, Matthew A. ; Nix, William D. ; Kenny, Thomas W.
Author_Institution :
Dept. of Mech. Eng., Univ. of California at Berkeley, Berkeley, CA, USA
Volume :
19
Issue :
2
fYear :
2010
fDate :
4/1/2010 12:00:00 AM
Firstpage :
229
Lastpage :
238
Abstract :
The Young´s modulus (E) of a material is a key parameter for mechanical engineering design. Silicon, the most common single material used in microelectromechanical systems (MEMS), is an anisotropic crystalline material whose material properties depend on orientation relative to the crystal lattice. This fact means that the correct value of E for analyzing two different designs in silicon may differ by up to 45%. However, perhaps, because of the perceived complexity of the subject, many researchers oversimplify silicon elastic behavior and use inaccurate values for design and analysis. This paper presents the best known elasticity data for silicon, both in depth and in a summary form, so that it may be readily accessible to MEMS designers.
Keywords :
Young´s modulus; crystal orientation; elasticity; elemental semiconductors; micromechanical devices; silicon; MEMS; Si; Young´s modulus; anisotropic crystalline material; elasticity; microelectromechanical systems; silicon; Elastic modulus; Poisson´s ratio; Young´s modulus; elasticity; microelectromechanical systems (MEMS) design; shear modulus; silicon;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/JMEMS.2009.2039697
Filename :
5430873
Link To Document :
بازگشت