• DocumentCode
    1439952
  • Title

    ANOVA-Based Approach for DAC Diagnostics

  • Author

    Arco, Mauro D. ; Liccardo, Annalisa ; Pasquino, Nicola

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Naples Federico II, Naples, Italy
  • Volume
    61
  • Issue
    7
  • fYear
    2012
  • fDate
    7/1/2012 12:00:00 AM
  • Firstpage
    1874
  • Lastpage
    1882
  • Abstract
    In order to assess the performance of digital-to-analog converters (DAC) the attention is generally focused on the integral nonlinearity INL. Useful diagnostic tools to detect the causes of poor linearity are the linearity and intermodulation errors, which can be evaluated from INL measurements. Linearity and intermodulation errors highlight and quantify erroneous calibration and unwanted interactions between current sources inside the DAC hardware. Unfortunately, their estimates, particularly those related to high-order intermodulation errors are characterized by high uncertainty. On the base of their very uncertain value, it is difficult to establish if interactions represent relevant factors or not. It is shown that by means of the analysis of variance (ANOVA) the relevance of intermodulation errors can be assessed from a limited set counting a minimum of two INL measurements. ANOVA is in fact capable of distinguishing if the variance in INL measurements has to be addressed to active factors or noise, even if the effect of each factor is widespread upon different elements of the INL array and in different combinations with the other factors.
  • Keywords
    digital-analogue conversion; intermodulation; statistical analysis; ANOVA-based approach; DAC diagnostics; INL array; INL measurement; analysis of variance; digital-to-analog converter; high-order intermodulation error; integral nonlinearity; Analysis of variance; Estimation; Linearity; Measurement uncertainty; Software; Uncertainty; Vectors; Analysis of variance (ANOVA); contrasts; design of experiments (DOE); integral nonlinearity (INL); intermodulation errors; linearity errors; test matrix;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2011.2182251
  • Filename
    6145658