DocumentCode :
1440013
Title :
Distributed MEMS Tunable Impedance-Matching Network Based on Suspended Slow-Wave Structure Fabricated in a Standard CMOS Technology
Author :
Fouladi, Siamak ; Domingue, Frédéric ; Zahirovic, Nino ; Mansour, Raafat R.
Author_Institution :
Electr. & Comput. Eng. Dept., Univ. of Waterloo, Waterloo, ON, Canada
Volume :
58
Issue :
4
fYear :
2010
fDate :
4/1/2010 12:00:00 AM
Firstpage :
1056
Lastpage :
1064
Abstract :
A tunable RF microelectromechanical system (MEMS) impedance-matching network operating at a frequency band from 13 to 24 GHz based on the distributed microelectromechanical transmission line (DMTL) concept is presented in this paper. The network is implemented using a standard 0.35- ??m CMOS technology and employs a novel suspended slow-wave (SSW) structure on a silicon substrate. The SSW structure results in a reduced total footprint and enhanced impedance coverage. The 8-bit DMTL matching network, fabricated using switched MEMS capacitors and SSW coplanar waveguide on a silicon substrate, results in a wide coverage of the Smith chart up to a maximum voltage standing-wave ratio of 11.5:1 with an impedance matching better than 10 dB and a power transfer ratio of better than -2.84 dB at 24 GHz. To our knowledge, this is the first implementation of a DMTL tunable MEMS impedance-matching network using a standard CMOS technology.
Keywords :
CMOS integrated circuits; capacitors; coplanar waveguides; impedance matching; micromechanical devices; slow wave structures; transmission lines; CMOS technology; MEMS tunable impedance-matching network; RF microelectromechanical system; SSW coplanar waveguide; Smith chart; distributed microelectromechanical transmission line; frequency 13 GHz to 24 GHz; size 0.35 mum; suspended slow-wave structure; switched MEMS capacitors; CMOS microelectromechanical systems (CMOS-MEMS) integration; RF MEMS; slow-wave transmission lines; tunable impedance-matching networks;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2010.2042511
Filename :
5430884
Link To Document :
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