DocumentCode :
14401
Title :
Modeling Oscillator Injection Locking Using the Phase Domain Response
Author :
Dunwell, Dustin ; Carusone, Anthony Chan
Author_Institution :
Edward S. Rogers Sr. Dept. of Electr. & Comput. Eng., Univ. of Toronto, Toronto, ON, Canada
Volume :
60
Issue :
11
fYear :
2013
fDate :
Nov. 2013
Firstpage :
2823
Lastpage :
2833
Abstract :
This paper presents a simulation-based model for the behavior of injection-locked oscillators (ILOs) that can be applied to any oscillator topology under any strength of injected signal. By using the phase domain response (PDR) of an oscillator, the proposed model is shown to accurately predict the behavior of ILOs with asymmetric lock ranges or those using injection into multiple locations. It can also model subharmonic injection locking behavior. The model is validated through comparison with SPICE simulations as well as measured results of a multiplying ILO fabricated in 65-nm CMOS.
Keywords :
CMOS integrated circuits; SPICE; injection locked oscillators; integrated circuit modelling; SPICE simulations; asymmetric lock ranges; injected signal; oscillator injection locking; oscillator topology; phase domain response; size 65 nm; subharmonic injection locking behavior; Frequency multiplication; impulse sensitivity function (ISF); injection locking; jitter tracking; locking range; locking time; phase-domain modeling;
fLanguage :
English
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-8328
Type :
jour
DOI :
10.1109/TCSI.2013.2252654
Filename :
6496169
Link To Document :
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