Title :
A configurable DRAM macro design for 2112 derivative organizations to be synthesized using a memory generator
Author :
Yabe, Tomoaki ; Miyano, Shinji ; Sato, Katsuhiko ; Wada, Masaharu ; Haga, Ryo ; Wada, Osamu ; Enkaku, Motohiro ; Hojyo, Takehiko ; Mimoto, Kenichiro ; Tazawa, Masaaki ; Ohkubo, Tsutomu ; Numata, Kenji
Author_Institution :
Toshiba Corp., Kasagawa, Japan
fDate :
11/1/1998 12:00:00 AM
Abstract :
This paper describes a DRAM macro design from which 2112 configurations up to 32 Mb can be synthesized using a memory generator. The memory generator automatically creates the layout of a DRAM macro in accordance with specification inputs such as memory capacity, address count, bank count, and I/O bits count. An expandable floor layout scheme achieves the macro size comparable to that of handicraft-designed DRAM. The memory generator can customize a configurable redundancy scheme for various macro configurations. Unified testing circuits make it possible to test DRAM macros with more than 500 interface pins in a direct-memory-access mode with 33 test pads. Up to four macros on the same chip can be tested with them. Test chips with 4-Mb DRAM and with 20-Mb DRAM fabricated with 0.35-μm technology showed 150-MHz operation
Keywords :
DRAM chips; application specific integrated circuits; integrated circuit design; integrated circuit testing; memory architecture; redundancy; 0.35 micron; 150 MHz; 4 to 32 Mbit; address count; bank count; configurable DRAM macro design; configurable redundancy scheme; direct-memory-access mode; expandable floor layout scheme; memory capacity; memory generator; specification inputs; unified testing circuits; Application specific integrated circuits; Buffer storage; Circuit testing; Data engineering; Design methodology; Graphics; Large scale integration; Pins; Random access memory; Workstations;
Journal_Title :
Solid-State Circuits, IEEE Journal of