Title :
Demonstration of a far-infrared streak camera
Author :
Drabbels, Marcel ; Lankhuijzen, G.M. ; Noordam, L.D.
Author_Institution :
FOM Inst. for Atomic & Molecular Phys., Amsterdam, Netherlands
fDate :
11/1/1998 12:00:00 AM
Abstract :
An atomic infrared (IR) streak camera is demonstrated that operates in the mid- and far-infrared (λ=5-85 μm), well beyond the long wavelength cutoff of conventional streak cameras. The temporal and spectral characteristics of the streak camera are determined using the FELIX free-electron laser as the IR light source. The temporal resolution of the streak camera was found to be as short as 1.2 ps. The high sensitivity of the streak camera is demonstrated by single-shot characterization of the IR pulses of FELIX
Keywords :
free electron lasers; infrared detectors; laser variables measurement; streak cameras; 1.2 ps; 5 to 85 mum; Cs; FELIX free-electron laser; IR light source; IR pulses; K; atomic IR streak camera; far-infrared; far-infrared streak camera; high sensitivity; mid-infrared; single-shot characterization; spectral characteristics; temporal characteristics; temporal resolution; Autocorrelation; Cameras; Cathodes; Crystals; Free electron lasers; Frequency; Infrared detectors; Optical pulses; Pulse measurements; Ultrafast optics;
Journal_Title :
Quantum Electronics, IEEE Journal of
