Demonstration of a far-infrared streak camera

Author

Drabbels, Marcel ; Lankhuijzen, G.M. ; Noordam, L.D.

Author_Institution

FOM Inst. for Atomic & Molecular Phys., Amsterdam, Netherlands

Volume

34

Issue

11

fYear

1998

fDate

11/1/1998 12:00:00 AM

Firstpage

2138

Lastpage

2144

Abstract

An atomic infrared (IR) streak camera is demonstrated that operates in the mid- and far-infrared (λ=5-85 μm), well beyond the long wavelength cutoff of conventional streak cameras. The temporal and spectral characteristics of the streak camera are determined using the FELIX free-electron laser as the IR light source. The temporal resolution of the streak camera was found to be as short as 1.2 ps. The high sensitivity of the streak camera is demonstrated by single-shot characterization of the IR pulses of FELIX

Keywords

free electron lasers; infrared detectors; laser variables measurement; streak cameras; 1.2 ps; 5 to 85 mum; Cs; FELIX free-electron laser; IR light source; IR pulses; K; atomic IR streak camera; far-infrared; far-infrared streak camera; high sensitivity; mid-infrared; single-shot characterization; spectral characteristics; temporal characteristics; temporal resolution; Autocorrelation; Cameras; Cathodes; Crystals; Free electron lasers; Frequency; Infrared detectors; Optical pulses; Pulse measurements; Ultrafast optics;

fLanguage

English

Journal_Title

Quantum Electronics, IEEE Journal of

Publisher

ieee

ISSN

0018-9197

Type

jour

DOI

10.1109/3.726606

Filename

726606