• DocumentCode
    1440364
  • Title

    Erratum to “Determining the Electronic Properties of Individual Nanointerfaces by Combining Intermittent AFM Imaging and Contact Spectroscopy” [Nov 10 741-744]

  • Author

    Kraya, R. A. ; Bonnell, D. A.

  • Author_Institution
    Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia, USA
  • Volume
    10
  • Issue
    1
  • fYear
    2011
  • Firstpage
    183
  • Lastpage
    183
  • Abstract
    In the above titled paper (ibid., vol. 9, no. 6, pp. 741-744, Nov. 10), an incorrect version of Fig. 1 was reflected. The correct version of Fig. 1 is presented here.
  • Keywords
    Atomic force microscopy; Nanoparticles; Semiconductor-metal interfaces; Thermionic emission;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2010.2093810
  • Filename
    5705642
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1440364