Title :
Erratum to “Determining the Electronic Properties of Individual Nanointerfaces by Combining Intermittent AFM Imaging and Contact Spectroscopy” [Nov 10 741-744]
Author :
Kraya, R. A. ; Bonnell, D. A.
Author_Institution :
Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia, USA
Abstract :
In the above titled paper (ibid., vol. 9, no. 6, pp. 741-744, Nov. 10), an incorrect version of Fig. 1 was reflected. The correct version of Fig. 1 is presented here.
Keywords :
Atomic force microscopy; Nanoparticles; Semiconductor-metal interfaces; Thermionic emission;
Journal_Title :
Nanotechnology, IEEE Transactions on
DOI :
10.1109/TNANO.2010.2093810
