• DocumentCode
    1440483
  • Title

    Phase stability of gyroklystron amplifier

  • Author

    Park, Gun-Sik ; Granatstein, Victor L. ; Latham, Peter E. ; Armstrong, Carter M. ; Ganguly, Achintya K. ; Park, S.Y.

  • Author_Institution
    Lab. for Plasma Res., Maryland Univ., College Park, MD, USA
  • Volume
    19
  • Issue
    4
  • fYear
    1991
  • fDate
    8/1/1991 12:00:00 AM
  • Firstpage
    632
  • Lastpage
    640
  • Abstract
    Expressions are derived for RF phase stability in conventional klystrons and gyroklystrons. Phase noise is found to depend on electron energy in a completely different way for the two types of devices, due to the inherent differences in gun dynamics and interaction mechanisms. In general, phase stability is better in gyroklystrons operating at voltage ⩽100 kV, while klystrons have somewhat better phase stability at higher operating voltage. An experimental study of phase stability in a four-cavity, 7.5-kV conventional klystron and in a three-cavity, 30-kV gyroklystron confirmed theoretical predictions. Phase sensitivity in the conventional klystron was 13° per percent change in voltage, and in gyroklystron was 4° per percent change in voltage. The magnitude and frequency of the measured phase jitter was well correlated with the droop and ripple on the beam voltage. Phase sensitivity to other parameters such as input power, magnetic field strength, and input frequency were also studied experimentally
  • Keywords
    gyrotrons; microwave amplifiers; stability; 100 kV; 30 kV; 7.5 kV; RF phase stability; droop; four cavity klystron; gun dynamics; gyroklystron amplifier; input frequency; input power; interaction mechanisms; magnetic field strength; phase jitter; phase noise; ripple; three cavity gyroklystron; Electrons; Frequency measurement; Klystrons; Magnetic field measurement; Phase measurement; Phase noise; Radio frequency; Radiofrequency amplifiers; Stability; Voltage;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/27.90329
  • Filename
    90329