• DocumentCode
    1440829
  • Title

    Deterministic annealing for clustering, compression, classification, regression, and related optimization problems

  • Author

    Rose, Kenneth

  • Author_Institution
    Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
  • Volume
    86
  • Issue
    11
  • fYear
    1998
  • fDate
    11/1/1998 12:00:00 AM
  • Firstpage
    2210
  • Lastpage
    2239
  • Abstract
    The deterministic annealing approach to clustering and its extensions has demonstrated substantial performance improvement over standard supervised and unsupervised learning methods in a variety of important applications including compression, estimation, pattern recognition and classification, and statistical regression. The application-specific cost is minimized subject to a constraint on the randomness of the solution, which is gradually lowered. We emphasize the intuition gained from analogy to statistical physics. Alternatively the method is derived within rate-distortion theory, where the annealing process is equivalent to computation of Shannon´s rate-distortion function, and the annealing temperature is inversely proportional to the slope of the curve. The basic algorithm is extended by incorporating structural constraints to allow optimization of numerous popular structures including vector quantizers, decision trees, multilayer perceptrons, radial basis functions, and mixtures of experts
  • Keywords
    data compression; maximum entropy methods; multilayer perceptrons; pattern recognition; simulated annealing; statistical analysis; Shannon rate-distortion function; clustering; data compression; deterministic annealing; maximum entropy; multilayer perceptrons; optimization; pattern recognition; quantization; statistical regression; Annealing; Constraint optimization; Costs; Decision trees; Multilayer perceptrons; Pattern recognition; Physics; Rate-distortion; Temperature; Unsupervised learning;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/5.726788
  • Filename
    726788