Wideband measurement system for on-chip ESD waveform characterisation

In this age where new electronic designs are constantly pushing the limits of technology, there is a persistent need for better electrostatic discharge (ESD) protection. Proposed is a measurement probe architecture that can be used for on-chip ESD waveform characterisation. The probe circuit design is presented and test results show the feasibility of the proposed system. Such a measurement system provides invaluable information, aiding the electronics designer in the search for more robust chip designs.