• DocumentCode
    1441415
  • Title

    The relation between transverse mechanical and electrical properties of the multi-twisted stage cables of CICC

  • Author

    Ono, M. ; Arata, M. ; Hamajima, T. ; Maeda, H. ; Takano, H. ; Fujioka, T.

  • Author_Institution
    Toshiba Corp., Yokohama, Japan
  • Volume
    7
  • Issue
    2
  • fYear
    1997
  • fDate
    6/1/1997 12:00:00 AM
  • Firstpage
    808
  • Lastpage
    811
  • Abstract
    The transverse resistance among strands of multi-stage twisted cables is one of the most important parameters to decide the stability and the AC losses. This value is varied with the cable compression affected by the void fraction or the Lorentz forces under charging. Furthermore it is also influenced by cyclic number of transversal compression. This paper describes the basic mechanical property of the chrome plated NbTi cable for the transverse compression, and the relation of the transverse resistance and the internal loads of the cable by measuring the impedance and the rigidity for various internal loads. It shows that the transverse resistance, which is much influenced with the performance of conductor, is always changed corresponding to the compressive load and dose not indicate the same resistance after release from the compression because of its elastic hysteresis.
  • Keywords
    niobium alloys; superconducting cables; superconducting magnets; titanium alloys; AC loss; Lorentz force; NbTi; charging; chrome plated NbTi; cyclic number; elastic hysteresis; electrical properties; impedance; internal load; mechanical properties; multi-twisted stage cable; multistrand superconducting CICC; resistance; rigidity; stability; transverse compression; transverse resistance; void fraction; Conductors; Electric resistance; Electrical resistance measurement; Impedance measurement; Mechanical cables; Mechanical factors; Mechanical variables measurement; Niobium compounds; Stability; Titanium compounds;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.614626
  • Filename
    614626