• DocumentCode
    1441509
  • Title

    Mitigation of Inrush Currents in Network Transformers by Reducing the Residual Flux With an Ultra-Low-Frequency Power Source

  • Author

    Kovan, B. ; de Leon, F. ; Czarkowski, D. ; Zabar, Z. ; Birenbaum, L.

  • Author_Institution
    Polytech. Inst., New York Univ., New York, NY, USA
  • Volume
    26
  • Issue
    3
  • fYear
    2011
  • fDate
    7/1/2011 12:00:00 AM
  • Firstpage
    1563
  • Lastpage
    1570
  • Abstract
    A methodology for the reduction of the residual flux in network transformers is proposed in this paper. The purpose is the mitigation of large inrush currents taken by numerous transformers when a long feeder is energized. Time-domain simulations are used to prove that a small-power device can substantially reduce the residual flux of all transformers simultaneously. The device consists of a low-voltage dc source, a suitable power-electronic switching unit, and a simple controller. Before a feeder is re-energized, the residual flux is reduced to a minimum and, as a consequence, the large inrush currents are reduced to an acceptable level. This greatly enhances the probability for the feeder to be successfully energized when otherwise a false trip would have occurred. Inrush current reductions of more than 60% are obtained at the head of the feeder.
  • Keywords
    current transformers; magnetic flux; power electronics; power transformer protection; probability; residual current devices; time-domain analysis; false trip; inrush current mitigation; inrush current reduction; low voltage DC source; network transformer; power device; power electronic switching unit; probability; residual flux; time-domain simulation; ultra low frequency power source; Circuit faults; Demagnetization; Inductors; Phase transformers; Surge protection; Surges; Transformer cores; Inrush currents; mitigation of inrush currents; residual flux reduction; transformers;
  • fLanguage
    English
  • Journal_Title
    Power Delivery, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8977
  • Type

    jour

  • DOI
    10.1109/TPWRD.2010.2102778
  • Filename
    5706392