• DocumentCode
    1441921
  • Title

    Distortion of a charge cloud shape inside the CCD produced by an X-ray photon

  • Author

    Tsunemi, H. ; Hiraga, J. ; Miyata, E. ; Yoshita, K. ; Ohtani, M.

  • Author_Institution
    Graduate Sch. of Sci., Osaka Univ., Japan
  • Volume
    47
  • Issue
    6
  • fYear
    2000
  • fDate
    12/1/2000 12:00:00 AM
  • Firstpage
    2014
  • Lastpage
    2019
  • Abstract
    A charge cloud produced by an X-ray photon in a charge coupled device (CCD) has a finite size. The size can be measured using a mesh experiment: the X-ray interaction position is restricted with subpixel precision by using the small mesh holes. This enables us to measure the charge cloud shape produced by an X-ray photon in the CCD. We measured charge cloud size for Al-K X-rays and for Mo-L X-rays. At both energies, we find the charge cloud shapes to be elongated perpendicular to the charge transfer direction. We confirmed the symmetric shape of the mesh hole both by SEM photography and by an experimental technique, and conclude that the elongation of the charge cloud shape is not an artifact of the experimental setup. We then applied an image restoration technique to directly measure the actual hole shape from the X-ray data. The inferred hole size is bigger than the geometrical shape due to diffraction of the incident X-rays by the mesh holes. We conclude that the distortion of the charge cloud shape is due to the asymmetry of the electric field in the CCD
  • Keywords
    CCD image sensors; X-ray detection; silicon radiation detectors; Al-K X-rays; Mo-L X-rays; SEM photography; Si; X-ray interaction position; X-ray photon; charge cloud shape; charge coupled device; charge transfer direction; image restoration technique; mesh hole; Charge coupled devices; Charge measurement; Charge-coupled image sensors; Clouds; Current measurement; Distortion measurement; Position measurement; Shape measurement; Size measurement; X-ray imaging;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.903838
  • Filename
    903838