DocumentCode
1442462
Title
BIST to Detect and Characterize Transient and Parametric Failures
Author
Sanyal, Alodeep ; Alam, Syed M. ; Kundu, Sandip
Volume
27
Issue
5
fYear
2010
Firstpage
50
Lastpage
59
Abstract
The continual scaling of device dimensions is increasing both parametric failures, stemming from circuit marginality issues, and soft errors, from the impact of high-energy particles on semiconductor surfaces. Effectively detecting and estimating such intermittent failures is crucial for reliability, availability, and serviceability (RAS) characterization of chips. This BIST-based approach distinguishes intermittent failures from permanent failures and reduces test time and cost.
Keywords
built-in self test; failure analysis; integrated circuit testing; reliability; built-in self test; circuit marginality; parametric failure detection; reliability availability serviceability; soft errors; transient failure detection; Automatic testing; Built-in self-test; Circuit testing; Costs; Delay effects; Error analysis; Hardware; Integrated circuit measurements; Semiconductor device measurement; Time measurement; BIST; design and test; linear feedback shift register; multiple input signature register; parametric failure; soft error;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2010.30
Filename
5432124
Link To Document