Title :
Blind Image Deconvolution Using Machine Learning for Three-Dimensional Microscopy
Author :
Kenig, Tal ; Kam, Zvi ; Feuer, Arie
Author_Institution :
Electr. Eng. Fac., Technion - Israel Inst. of Technol., Haifa, Israel
Abstract :
In this work, we propose a novel method for the regularization of blind deconvolution algorithms. The proposed method employs example-based machine learning techniques for modeling the space of point spread functions. During an iterative blind deconvolution process, a prior term attracts the point spread function estimates to the learned point spread function space. We demonstrate the usage of this regularizer within a Bayesian blind deconvolution framework and also integrate into the latter a method for noise reduction, thus creating a complete blind deconvolution method. The application of the proposed algorithm is demonstrated on synthetic and real-world three-dimensional images acquired by a wide-field fluorescence microscope, where the need for blind deconvolution algorithms is indispensable, yielding excellent results.
Keywords :
Bayes methods; deconvolution; image denoising; learning by example; microscopy; Bayesian blind deconvolution framework; blind image deconvolution algorithm; example based machine learning techniques; noise reduction; point spread function; three dimensional microscopy; wide field fluorescence microscope; Convolution; Deconvolution; Degradation; Kernel; Machine learning; Machine learning algorithms; Microscopy; Optoelectronic and photonic sensors; Pixel; Principal component analysis; Blind deconvolution; PCA; deblurring; kernel PCA; machine learning; microscopy.; Algorithms; Artificial Intelligence; Bayes Theorem; Computer Simulation; Databases, Factual; Fourier Analysis; Image Processing, Computer-Assisted; Microscopy, Fluorescence; Principal Component Analysis;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2010.45