• DocumentCode
    1442847
  • Title

    Blind Image Deconvolution Using Machine Learning for Three-Dimensional Microscopy

  • Author

    Kenig, Tal ; Kam, Zvi ; Feuer, Arie

  • Author_Institution
    Electr. Eng. Fac., Technion - Israel Inst. of Technol., Haifa, Israel
  • Volume
    32
  • Issue
    12
  • fYear
    2010
  • Firstpage
    2191
  • Lastpage
    2204
  • Abstract
    In this work, we propose a novel method for the regularization of blind deconvolution algorithms. The proposed method employs example-based machine learning techniques for modeling the space of point spread functions. During an iterative blind deconvolution process, a prior term attracts the point spread function estimates to the learned point spread function space. We demonstrate the usage of this regularizer within a Bayesian blind deconvolution framework and also integrate into the latter a method for noise reduction, thus creating a complete blind deconvolution method. The application of the proposed algorithm is demonstrated on synthetic and real-world three-dimensional images acquired by a wide-field fluorescence microscope, where the need for blind deconvolution algorithms is indispensable, yielding excellent results.
  • Keywords
    Bayes methods; deconvolution; image denoising; learning by example; microscopy; Bayesian blind deconvolution framework; blind image deconvolution algorithm; example based machine learning techniques; noise reduction; point spread function; three dimensional microscopy; wide field fluorescence microscope; Convolution; Deconvolution; Degradation; Kernel; Machine learning; Machine learning algorithms; Microscopy; Optoelectronic and photonic sensors; Pixel; Principal component analysis; Blind deconvolution; PCA; deblurring; kernel PCA; machine learning; microscopy.; Algorithms; Artificial Intelligence; Bayes Theorem; Computer Simulation; Databases, Factual; Fourier Analysis; Image Processing, Computer-Assisted; Microscopy, Fluorescence; Principal Component Analysis;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2010.45
  • Filename
    5432190