DocumentCode :
1443002
Title :
Comparison of time base nonlinearity measurement techniques
Author :
Stenbakken, Gerard N. ; Deyst, John P.
Author_Institution :
Dept. of Commerce, Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Volume :
47
Issue :
1
fYear :
1998
fDate :
2/1/1998 12:00:00 AM
Firstpage :
34
Lastpage :
39
Abstract :
Distortions in the time bases of equivalent-time oscilloscopes and digitizers cause distortions of waveforms sampled by them. This paper reports on a comparison of two methods of characterizing time base distortion, using pure sine-wave inputs of known frequency: the “sinefit” and the “analytic signal” methods. Simulations are used to compare the performance of the two methods versus different types of time base distortion, different sine-wave frequencies, number of different sine-wave phases, levels of random noise, and levels of random jitter. The performance of the two methods varies considerably, dependent upon the input signal frequency and type of time base distortion. Each method does much better than the other for certain cases
Keywords :
curve fitting; digital simulation; electric distortion measurement; electronic engineering computing; jitter; nonlinear distortion; random noise; time bases; waveform analysis; analytic signal; digitizers; equivalent-time oscilloscopes; nonlinearity measurement; performance; random jitter; random noise; simulation; sine-wave inputs; sinefit; time base distortion; waveforms distortion; Delay; Distortion measurement; Frequency; Jitter; Measurement techniques; Nonlinear distortion; Oscilloscopes; Phase distortion; Pulse generation; Sampling methods;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.728785
Filename :
728785
Link To Document :
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