The effective resolution measurements in scope of sine-fit test

Author

Hejn, Konrad ; Pacut, Andrzej ; Kramarski, Leszek

Author_Institution

Fac. of Electron. & Inf. Technol., Warsaw Univ. of Technol., Poland

Volume

47

Issue

1

fYear

1998

fDate

2/1/1998 12:00:00 AM

Firstpage

45

Lastpage

50

Abstract

This paper presents a detailed analysis of the effective resolution (efr) measurements in scope of the IEEE Standard 1057 sine-fit test. The results explain not only a poor repeatability in the efr measurement but also give some hints how to improve it. The two-point method proposed here enables the compensation of the inherent bias influence on the efr accuracy. The idea is accomplished by using the correct standard deviation in the efr definition. The standard deviation depends on the amplitude V and dc bias C of a pure sine wave stimulus

Keywords

IEEE standards; analogue-digital conversion; automatic testing; circuit simulation; curve fitting; digital simulation; error analysis; A/D conversion; IEEE Standard 1057; circuit simulation; compensation; effective resolution measurement; quantisation; repeatability; sine wave stimulus; sine-fit test; standard deviation; two-point method; Analog-digital conversion; Circuit simulation; Circuit testing; Error analysis; Histograms; Information technology; Measurement standards; Quantization; Standards development; Threshold voltage;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.728787

Filename

728787