Title :
The effective resolution measurements in scope of sine-fit test
Author :
Hejn, Konrad ; Pacut, Andrzej ; Kramarski, Leszek
Author_Institution :
Fac. of Electron. & Inf. Technol., Warsaw Univ. of Technol., Poland
fDate :
2/1/1998 12:00:00 AM
Abstract :
This paper presents a detailed analysis of the effective resolution (efr) measurements in scope of the IEEE Standard 1057 sine-fit test. The results explain not only a poor repeatability in the efr measurement but also give some hints how to improve it. The two-point method proposed here enables the compensation of the inherent bias influence on the efr accuracy. The idea is accomplished by using the correct standard deviation in the efr definition. The standard deviation depends on the amplitude V and dc bias C of a pure sine wave stimulus
Keywords :
IEEE standards; analogue-digital conversion; automatic testing; circuit simulation; curve fitting; digital simulation; error analysis; A/D conversion; IEEE Standard 1057; circuit simulation; compensation; effective resolution measurement; quantisation; repeatability; sine wave stimulus; sine-fit test; standard deviation; two-point method; Analog-digital conversion; Circuit simulation; Circuit testing; Error analysis; Histograms; Information technology; Measurement standards; Quantization; Standards development; Threshold voltage;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
