DocumentCode
1443177
Title
Playing together nicely
Author
Davidson, S.
Volume
28
Issue
1
fYear
2011
Firstpage
88
Lastpage
88
Abstract
The articles in this special issue on embedded memories present several answers to the eternal problem of trading off memory capacity, speed, and power. Unsurprisingly, each article describes attempts to find the best new memory technology. Test people, however, see memories differently: design people worry about how things work; test people worry about how things break. Although new memory technology is exciting, designers of embedded memories and researchers might be well advised to think more about making memories play better with the rest of the design rather than simply making them faster, denser, and less power hungry.
Keywords
embedded systems; logic design; logic testing; RTL; embedded memories; memory capacity; memory design; Embedded computing; Memory; Performance evaluation; creating tests; design and test; embedded memories; memory BIST;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2011.22
Filename
5708268
Link To Document