DocumentCode :
1443179
Title :
Basic study on the application of parametric spline functions to the holographic pattern measuring system
Author :
Taniguchi, Masanari ; Tsuchiya, Takashi ; Takagi, Tasuku
Author_Institution :
Fac. of Sci. & Technol., Meijo Univ., Nagoya, Japan
Volume :
47
Issue :
1
fYear :
1998
fDate :
2/1/1998 12:00:00 AM
Firstpage :
153
Lastpage :
157
Abstract :
The authors have developed a holographic pattern measuring system (HPMS) for quantitative measurement of microscopic displacement and mechanical vibration with high precision. In this study, a parametric spline function (PSF) was applied to the HPMS in order to obtain highly accurate smooth curves for fringe patterns from these holographic interferograms. The relation between the number of sampled points and the error rate was also investigated, and some experiments were conducted
Keywords :
displacement measurement; holographic interferometry; splines (mathematics); vibration measurement; error rate; fringe patterns; holographic interferogram; holographic pattern measuring system; mechanical vibration; microscopic displacement; parametric spline function; parametric spline functions; quantitative measurement; sampled points; smooth curves; Displacement measurement; Error analysis; Holography; Image processing; Interferometry; Laser beams; Mechanical variables measurement; Microscopy; Spline; Vibration measurement;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.728809
Filename :
728809
Link To Document :
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