Basic study on the application of parametric spline functions to the holographic pattern measuring system

Author

Taniguchi, Masanari ; Tsuchiya, Takashi ; Takagi, Tasuku

Author_Institution

Fac. of Sci. & Technol., Meijo Univ., Nagoya, Japan

Volume

47

Issue

1

fYear

1998

fDate

2/1/1998 12:00:00 AM

Firstpage

153

Lastpage

157

Abstract

The authors have developed a holographic pattern measuring system (HPMS) for quantitative measurement of microscopic displacement and mechanical vibration with high precision. In this study, a parametric spline function (PSF) was applied to the HPMS in order to obtain highly accurate smooth curves for fringe patterns from these holographic interferograms. The relation between the number of sampled points and the error rate was also investigated, and some experiments were conducted

Keywords

displacement measurement; holographic interferometry; splines (mathematics); vibration measurement; error rate; fringe patterns; holographic interferogram; holographic pattern measuring system; mechanical vibration; microscopic displacement; parametric spline function; parametric spline functions; quantitative measurement; sampled points; smooth curves; Displacement measurement; Error analysis; Holography; Image processing; Interferometry; Laser beams; Mechanical variables measurement; Microscopy; Spline; Vibration measurement;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.728809

Filename

728809