DocumentCode
1443501
Title
´Tis the gift to be simple
Author
Nassif, Sani R.
Author_Institution
IBM Research—Austin
Volume
27
Issue
2
fYear
2010
Firstpage
84
Lastpage
86
Abstract
IC engineers rarely get to crash test their designs. Instead, they take pride in getting the design right the first time—no room for iterations and redesign. This is done by performing extensive computer simulations of designs. These simulations let engineers accurately predict the behavior of the design while it is still represented by computer data, before it ever becomes a real physical object.
Keywords
Automotive engineering; CMOS technology; Computational modeling; Computer simulation; Design engineering; Laboratories; Predictive models; Semiconductor device modeling; US Department of Transportation; Vehicle crash testing; IC design; modeling; simulation;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2010.32
Filename
5432330
Link To Document