• DocumentCode
    1443501
  • Title

    ´Tis the gift to be simple

  • Author

    Nassif, Sani R.

  • Author_Institution
    IBM Research—Austin
  • Volume
    27
  • Issue
    2
  • fYear
    2010
  • Firstpage
    84
  • Lastpage
    86
  • Abstract
    IC engineers rarely get to crash test their designs. Instead, they take pride in getting the design right the first time—no room for iterations and redesign. This is done by performing extensive computer simulations of designs. These simulations let engineers accurately predict the behavior of the design while it is still represented by computer data, before it ever becomes a real physical object.
  • Keywords
    Automotive engineering; CMOS technology; Computational modeling; Computer simulation; Design engineering; Laboratories; Predictive models; Semiconductor device modeling; US Department of Transportation; Vehicle crash testing; IC design; modeling; simulation;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2010.32
  • Filename
    5432330