Author :
Lee, Kuan-Chou ; Hwu, Jenn-Gwo
Author_Institution :
National Taiwan University
Keywords :
Apertures; Delay; Educational institutions; Error correction; Light sources; Measurement standards; Photovoltaic cells; Power measurement; Testing; Tungsten;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.1998.728910
