DocumentCode :
1443960
Title :
Design of built-in test generator circuits using width compression
Author :
Chakrabarty, Krishnendu ; Murray, Brian T.
Volume :
17
Issue :
10
fYear :
1998
fDate :
10/1/1998 12:00:00 AM
Firstpage :
1044
Lastpage :
1051
Abstract :
We present a method for designing test generator circuits (TCCs) that incorporate a precomputed test set TD in the patterns they produce. Our method uses width compression based on the property of d-compatibles as well as compatibles and inverse compatibles and does not require access to a gate-level model of the circuit under test. The TGC consists of a counter, which generates a set of encoded test patterns TE and a decompression circuit, which consists of simple binary decoders that generate a final sequence containing TD . We show that partially specified test sets, i.e., those that contain a large number of don´t-cares, lead to more efficient TGCs. These TGCs are applicable to embedded core circuits whose detailed designs are not available. We demonstrate the effectiveness of our approach by presenting experimental results on width compression for the ISCAS´85 benchmark circuits and the full-scan versions of the ISCAS´89 benchmark circuits
Keywords :
automatic test pattern generation; built-in self test; embedded systems; integrated circuit testing; logic partitioning; logic testing; ISCAS´85 benchmark circuits; ISCAS´89 benchmark circuits; binary decoders; built-in test generator circuits; d-compatibles; decompression circuit; embedded core circuits; encoded test patterns; inverse compatibles; partially specified test sets; precomputed test set; width compression; Automatic test pattern generation; Automatic testing; Benchmark testing; Built-in self-test; Circuit faults; Circuit testing; Costs; Flip-flops; Logic testing; Test pattern generators;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.728923
Filename :
728923
Link To Document :
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